PATENTS

Nondestructive, absolute determination of thickness or depth in dielectric materials - AU 2014327105

Nondestructive, absolute determination of thickness or depth in dielectric materials - AU 2016100570

Nondestructive, absolute determination of thickness or depth in dielectric materials - CA 2962411

Nondestructive, absolute determination of thickness or depth in dielectric materials - EP 3049796

Nondestructive, absolute determination of thickness or depth in dielectric materials - JP 6392331

Nondestructive, absolute determination of thickness or depth in dielectric materials - MY PI 2016700974

Nondestructive, absolute determination of thickness or depth in dielectric materials - MX 357090

Nondestructive, absolute determination of thickness or depth in dielectric materials - NZ 718193

Nondestructive, absolute determination of thickness or depth in dielectric materials - PG PG/P/2016/00012

Nondestructive, absolute determination of thickness or depth in dielectric materials - SA 516370813

Nondestructive, absolute determination of thickness or depth in dielectric materials - SG 11201602177P

Nondestructive, absolute determination of thickness or depth in dielectric materials - TW I653428

Nondestructive, absolute determination of thickness or depth in dielectric materials - US 9989359

High-Resolution, Nondestructive imaging of dielectric materials - US 7777499

High-Resolution, Nondestructive imaging of dielectric materials - EP 1779123

High-Resolution, Nondestructive imaging of dielectric materials - CA 2962411

Apparatus and Method for nondestructive testing of dielectric materials - US 6359446

Interferometric localization of irregularities - US 6653847

Nondestructive Testing of Dielectric Materials - AU 746997

Nondestructive Testing of Dielectric Materials - CA 2304782

Nondestructive Testing of Dielectric Materials - EPO EP1017996